WebbM6 Hybrid SIMS High performance TOF-SIMS and Orbitrap SIMS combination instrument ideally suited for organic SIMS application. External link M6 Hybrid SIMS Product WebbIONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for …
IONTOF - TOF-SIMS (time of flight secondary ion mass …
Webb24 mars 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Webb5 jan. 2024 · 飞行时间二次离子质谱仪(TOF SIMS) 仪器分类: 谱学分析平台 仪器状态: 维护中 (洪宇浩) 所属单位: 厦门大学 > 石墨烯工程与产业研究院 仪器生产商: IONTOF 购置日期: 2024-01-05 使用模式: 项 … palmdale ca police station
产品-飞行时间二次离子质谱 (TOF-SIMS) 德国IONTOF
WebbGeneral explanation of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS).-----IONTOF homepage: www.iontof.comContact: [email protected] Webb+++ TOF-SIMS System Integration Engineer (m/f/d) wanted +++ We recently posted a little teaser for the available position above. Now the full job description… Webb20 juni 2024 · 使用ION-TOF GmbH 研发并获得专利保护的Burst模式,即可同时兼具高横向分辨率和高质量分辨率以及检测灵敏度。 该技术尤其适合特征表面上的痕量金属的检测和化学成像。 它是通过在每个一次离子脉冲循环期间显著增加轰击样品的一次离子数量,从而显著提升了二次离子计数率,由此兼具高横向分辨率和高质量分辨率。 什么是Burst 模式 … エグザイル ライブ コロナ